HS Code 9031.49.7000

Import Duty for Measuring Or Checking Instruments Appliances And Machines Not Specified Or Included Elsewhere In This Chapter Profile Projectors Parts And Accessories Thereof For Inspecting Masks Other Than Photomasks Used In Manufacturing Semiconductor Devices For Measuring Surface Particulate Contamination On Semiconductor Devices

Official Description

Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: > Other: > For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices

Hierarchy: Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof > Other > For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices

About Chapter 90

Within the hierarchy of Chapter 90 ("Optical fibers and optical fiber bundles; optical fiber cables other than those of heading 8544; sheets and plates of polarizing material; lenses (including contact lenses), prisms, mirrors and other optical elements, of any material, unmounted, other than such elements of glass not optically worked"), HS Code 9031.49.7000 is categorized under Machines for balancing mechanical parts. This precise classification is required for all import documentation.

Common Questions

What is the HTSUS heading for 9031.49.7000?

It falls under the category of Machines for balancing mechanical parts within Chapter 90 (Optical fibers and optical fiber bundles; optical fiber cables other than those of heading 8544; sheets and plates of polarizing material; lenses (including contact lenses), prisms, mirrors and other optical elements, of any material, unmounted, other than such elements of glass not optically worked). The specific description is Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: > Other: > For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices.

How is the duty rate calculated for 9031.49.7000?

Duty rates for 9031.49.7000 are subject to change annually. To get the most up-to-date 2026 rates including all fees, try the Tariff Calculator.

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